Marco Ottavi: search on Z-Library

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1

Design and Analysis of Single-Event Tolerant Slave Latches for Enhanced Scan Delay Testing

Yang Lu,, Lombardi, Fabrizio, Pontarelli, Salvatore, Ottavi, Marco

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2014

Language:

english

File:

PDF, 606 KB

english, 2014

2

A Double Error Correction Code for 32-bit Data Words with Efficent Decoding

Liu, Shanshan, Li, Jiaqiang, Reviriego, Pedro, Ottavi, Marco, Xiao, Liyi

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2018

Language:

english

File:

PDF, 504 KB

english, 2018

3

[IEEE 2017 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Cambridge (2017.10.23-2017.10.25)] 2017 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Detecting errors in instructions with bloom filters

Atamaner, Mert, Ergin, Oguz, Ottavi, Marco, Reviriego, Pedro

Year:

2017

Language:

english

File:

PDF, 152 KB

english, 2017

4

[IEEE 2020 15th Design & Technology of Integrated Systems in Nanoscale Era (DTIS) - Marrakech, Morocco (2020.4.1-2020.4.3)] 2020 15th Design & Technology of Integrated Systems in Nanoscale Era (DTIS) - A Microprocessor Protection Architecture against Hardware Trojans in Memories

Bolat, Alperen, Cassano, Luca, Reviriego, Pedro, Ergin, Oguz, Ottavi, Marco

Year:

2020

File:

PDF, 112 KB

2020

5

Characterisation & modelling of perovskite-based synaptic memristor device

Gupta, Vishal, Lucarelli, Giulia, Castro-Hermosa, Sergio, Brown, Thomas, Ottavi, Marco

Journal:

Microelectronics Reliability

Year:

2020

File:

PDF, 2.64 MB

2020

6

Towards defining a simplified procedure for COTS system-on-chip TID testing

Di Mascio, Stefano, Menicucci, Alessandra, Furano, Gianluca, Szewczyk, Tomasz, Campajola, Luigi, Di Capua, Francesco, Lucaroni, Andrea, Ottavi, Marco

Journal:

Nuclear Engineering and Technology

Year:

2018

Language:

english

File:

PDF, 2.72 MB

english, 2018

7

[IEEE 2018 13th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS) - Taormina, Italy (2018.4.9-2018.4.12)] 2018 13th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS) - Memristor based adaptive impedance and frequency tuning network

Palson, Chithra Liz, Das Krishna, Deepti, Mathew, Jimson, Jose, Babita Roslind, Ottavi, Marco, Gupta, Vishal

Year:

2018

Language:

english

File:

PDF, 1.83 MB

english, 2018

8

Reducing the Cost of Single Error Correction With Parity Sharing

Reviriego, Pedro, Pontarelli, Salvatore, Maestro, Juan Antonio, Ottavi, Marco

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2013

Language:

english

File:

PDF, 498 KB

english, 2013

9

A Synergetic Use of Bloom Filters for Error Detection and Correction

Reviriego, Pedro, Pontarelli, Salvatore, Maestro, Juan Antonio, Ottavi, Marco

Journal:

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Year:

2015

Language:

english

File:

PDF, 436 KB

english, 2015

10

PP170 Health Impact Assessment Of Teleradiology Programs In Disadvantaged Areas

Digiacomo, Giovanni, Perusia, Matteo, Romano, Valeria, Rivoiro, Chiara, Servetto, Rosario, Giacometti, Marika, Glisoni, Marco, Gualano, Maria Rosaria, Siliquini, Roberta, Grosso, Marco, Davini, Ottavi

Journal:

International Journal of Technology Assessment in Health Care

Year:

2017

Language:

english

File:

PDF, 576 KB

english, 2017

11

Total Ionizing Dose Effects on DRAM Data Retention Time

Bacchini, Angelo, Furano, Gianluca, Rovatti, Marco, Ottavi, Marco

Journal:

IEEE Transactions on Nuclear Science

Year:

2014

Language:

english

File:

PDF, 501 KB

english, 2014

12

Dependable Multicore Architectures at Nanoscale || Roadmap for On-Board Processing and Data Handling Systems in Space

Ottavi, Marco, Gizopoulos, Dimitris, Pontarelli, Salvatore

Year:

2018

Language:

english

File:

PDF, 612 KB

english, 2018

13

[IEEE 2019 IEEE 8th International Workshop on Advances in Sensors and Interfaces (IWASI) - Otranto, Italy (2019.6.13-2019.6.14)] 2019 IEEE 8th International Workshop on Advances in Sensors and Interfaces (IWASI) - Design and Implementation of a Flexible Interface for TID Detector

Fara, Iacopo, Luza, Lucas Matana, Boch, Jerome, Furano, Gianluca, Ottavi, Marco, Dilillo, Luigi

Year:

2019

Language:

english

File:

PDF, 565 KB

english, 2019

14

Design of a Nanometric CMOS Memory Cell for Hardening to a Single Event With a Multiple-Node Upset

D'Alessio, Marco, Ottavi, Marco, Lombardi, Fabrizio

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2014

Language:

english

File:

PDF, 730 KB

english, 2014

15

[IEEE 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Noordwijk, Netherlands (2019.10.2-2019.10.4)] 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Fault Tolerant Photovoltaic Array: A Repair Circuit Based on Memristor Sensing

Gnoli, Luca, Mathew, Jimson, Ottavi, Marco, Carnicelli, Giuseppe, Parisi, Alessio, Urbinati, Luca, Kabashi, Burim, Michieletti, Fabio, Ibarra, Sebastian Ignacio Peradotto, Vacca, Marco, Graziano, Mari

Year:

2019

Language:

english

File:

PDF, 1.94 MB

english, 2019

16

[IEEE 2018 IEEE Nuclear & Space Radiation Effects Conference (NSREC 2018) - Waikoloa, HI, USA (2018.7.16-2018.7.20)] 2018 IEEE Nuclear & Space Radiation Effects Conference (NSREC 2018) - Simplified Procedures for COTS TID Testing: A Comparison Between 90 Sr and 60 Co

Menicucci, Alessandra, Malatesta, Fabio, Di Capua, Francesco, Campajola, Luigi, Casolaro, Pierluigi, Furano, Gianluca, Di Mascio, Stefano, Ottavi, Marco

Year:

2018

Language:

english

File:

PDF, 1.16 MB

english, 2018

17

FastTag: A Technique to Protect Cache Tags Against Soft Errors

Reviriego, Pedro, Pontarelli, Salvatore, Ottavi, Marco, Maestro, Juan Antonio

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2014

Language:

english

File:

PDF, 442 KB

english, 2014

18

[IEEE Conference Publications Design Automation and Test in Europe - Dresden, Germany (2014.03.24-2014.03.28)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2014 - Complementary resistive switch based stateful logic operations using material implication

Yang, Yuanfan, Mathew, Jimson, Pradhan, Dhiraj K., Ottavi, Marco, Pontarelli, Salvatore

Year:

2014

Language:

english

File:

PDF, 317 KB

english, 2014

19

Analysis and Evaluations of Reliability of Reconfigurable FPGAs

Salvatore Pontarelli, Marco Ottavi, Vamsi Vankamamidi, Gian Carlo Cardarilli, Fabrizio Lombardi, Adelio Salsano

Journal:

Journal of Electronic Testing

Year:

2008

Language:

english

File:

PDF, 562 KB

english, 2008

20

Low Delay Single Symbol Error Correction Codes Based on Reed Solomon Codes

Pontarelli, Salvatore, Reviriego, Pedro, Ottavi, Marco, Maestro, Juan Antonio

Journal:

IEEE Transactions on Computers

Year:

2015

Language:

english

File:

PDF, 446 KB

english, 2015

21

Low Cost Memristor Associative Memory Design for Full and Partial Matching Applications

Yang, Yuanfan, Mathew, Jimson, Chakraborty, Rajat, Ottavi, Marco, Pradhan, Dhiraj

Journal:

IEEE Transactions on Nanotechnology

Year:

2016

Language:

english

File:

PDF, 2.61 MB

english, 2016

22

Introduction to the Special Section

Ottavi, Marco, Park, Nohpill

Journal:

IEEE Transactions on Nanotechnology

Year:

2013

Language:

english

File:

PDF, 91 KB

english, 2013

23

Guest Editorial: IEEE Transactions on Computers and IEEE Transactions on Emerging Topics in Computing Joint Special Section on Innovation in Reconfigurable Computing Fabrics from Devices to Architectures

DeMara, Ronald F., Platzner, Marco, Ottavi, Marco

Journal:

IEEE Transactions on Computers

Year:

2017

Language:

english

File:

PDF, 110 KB

english, 2017

24

[ACM Press the 2012 IEEE/ACM International Symposium - Amsterdam, The Netherlands (2012.07.04-2012.07.06)] Proceedings of the 2012 IEEE/ACM International Symposium on Nanoscale Architectures - NANOARCH '12 - A novel write-scheme for data integrity in memristor-based crossbar memories

Ruotolo, Angelo Giuseppe, Ottavi, Marco, Pontarelli, Salvatore, Lombardi, Fabrizio

Year:

2012

Language:

english

File:

PDF, 874 KB

english, 2012

25

Efficient sensing approaches for high-density memristor sensor array

Adeyemo, Adedotun, Mathew, Jimson, Jabir, Abusaleh, Natale, Corrado Di, Martinelli, Eugenio, Ottavi, Marco

Journal:

Journal of Computational Electronics

Year:

2018

Language:

english

File:

PDF, 1.64 MB

english, 2018

26

[IEEE 2011 IEEE 11th International Conference on Nanotechnology (IEEE-NANO) - Portland, OR (2011.08.15-2011.08.18)] 2011 11th IEEE International Conference on Nanotechnology - Modeling magnetic quantum-dot cellular automata by HDL

Ottavi, Marco, Pontarelli, Salvatore, Salsano, Adelio, Lombardi, Fabrizio

Year:

2011

Language:

english

File:

PDF, 721 KB

english, 2011

27

[IEEE Conference Publications Design Automation and Test in Europe - Dresden, Germany (2014.03.24-2014.03.28)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2014 - Complementary resistive switch based stateful logic operations using material implication

Yang, Yuanfan, Mathew, Jimson, Pradhan, Dhiraj K., Ottavi, Marco, Pontarelli, Salvatore

Year:

2014

Language:

english

File:

PDF, 317 KB

english, 2014

28

[IEEE 2010 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT) - Kyoto, Japan (2010.10.6-2010.10.8)] 2010 IEEE 25th International Symposium on Defect and Fault Tolerance in VLSI Systems - Modeling Open Defects in Nanometric Scale CMOS

Hariharan, Anant Narayan, Pontarelli, Salvatore, Ottavi, Marco, Lombardi, Fabrizio

Year:

2010

Language:

english

File:

PDF, 363 KB

english, 2010

29

Dependable Multicore Architectures at Nanoscale: The View From Europe

Ottavi, Marco, Pontarelli, Salvatore, Gizopoulos, Dimitris, Bolchini, Cristiana, Michael, Maria K., Anghel, Lorena, Tahoori, Mehdi, Paschalis, Antonis, Reviriego, Pedro, Bringmann, Oliver, Izosimov, V

Journal:

IEEE Design and Test

Year:

2015

Language:

english

File:

PDF, 362 KB

english, 2015

30

HDLQ

Ottavi, Marco, Schiano, Luca, Lombardi, Fabrizio, Tougaw, Douglas

Journal:

ACM Journal on Emerging Technologies in Computing Systems

Year:

2006

Language:

english

File:

PDF, 1011 KB

english, 2006

31

Novel Complementary Resistive Switch Crossbar Memory Write and Read Schemes

Yang, Yuanfan, Mathew, Jimson, Ottavi, Marco, Pontarelli, Salvatore, Pradhan, D. K.

Journal:

IEEE Transactions on Nanotechnology

Year:

2015

Language:

english

File:

PDF, 649 KB

english, 2015

32

[IEEE 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) - New York City, NY, USA (2013.10.2-2013.10.4)] 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) - F-DICE: A multiple node upset tolerant flip-flop for highly radioactive environments

Campitelli, Stefano, Ottavi, Marco, Pontarelli, Salvatore, Marchioro, Alessandro, Felici, Daniele, Lombardi, Fabrizio

Year:

2013

Language:

english

File:

PDF, 990 KB

english, 2013

33

Deciphering the Role of Oncogenic MITFE318K in Senescence Delay and Melanoma Progression

Bonet, Caroline, Luciani, Flavie, Ottavi, Jean-François, Leclerc, Justine, Jouenne, Fanélie-Marie, Boncompagni, Marina, Bille, Karine, Hofman, Véronique, Bossis, Guillaume, Marco de Donatis, Gian, Str

Journal:

JNCI Journal of the National Cancer Institute

Year:

2017

Language:

english

File:

PDF, 1.34 MB

english, 2017

34

[IEEE 2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS) - Thessaloniki, Greece (2017.7.3-2017.7.5)] 2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS) - Reliable gas sensing with memristive array

Adeyemo, Adedotun, Jabir, Abusaleh, Mathew, Jimson, Martinelli, Eugenio, Di Natale, Corrado, Ottavi, Marco

Year:

2017

Language:

english

File:

PDF, 225 KB

english, 2017

35

[IEEE 2016 International Conference on Design and Technology of Integrated Systems in Nanoscale Era (DTIS) - Istanbul, Turkey (2016.4.12-2016.4.14)] 2016 International Conference on Design and Technology of Integrated Systems in Nanoscale Era (DTIS) - Qualitative techniques for System-on-Chip test with low-energy protons

Di Mascio, Stefano, Ottavi, Marco, Furano, Gianluca, Szewczyk, Tomasz, Menicucci, Alessandra, Campajola, Luigi, Di Capua, Francesco

Year:

2016

Language:

english

File:

PDF, 517 KB

english, 2016

36

[IEEE 2018 13th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS) - Taormina, Italy (2018.4.9-2018.4.12)] 2018 13th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS) - Setup and experimental results analysis of COTS Camera and SRAMs at the ISIS neutron facility

Ottavi, Marco, Asciolla, Dario, Fiorucci, Tiziano, Grosso, Elena, Marzullo, Carla, Scaramella, Alessandro, Stramaccioni, Simone, Zibecchi, Alessia, Andreani, Carla, Cardarilli, Gian Carlo, Cazzaniga,

Year:

2018

Language:

english

File:

PDF, 288 KB

english, 2018

37

Error Detection and Correction in Content Addressable Memories by Using Bloom Filters

Pontarelli, Salvatore, Ottavi, Marco

Journal:

IEEE Transactions on Computers

Year:

2013

Language:

english

File:

PDF, 2.10 MB

english, 2013

38

[IEEE 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Vancouver, BC, Canada (2011.10.3-2011.10.5)] 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems - On the Effects of Intra-gate Resistive Open Defects in Gates at Nanoscaled CMOS

Rajderkar, Nachiket, Ottavi, Marco, Pontarelli, Salvatore, Han, Jie, Lombardi, Fabrizio

Year:

2011

Language:

english

File:

PDF, 799 KB

english, 2011

39

[IEEE 2018 13th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS) - Taormina, Italy (2018.4.9-2018.4.12)] 2018 13th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS) - Two dimensional FFT architecture based on radix-4 3 algorithm with efficient output reordering

Kala, S, Nalesh, S, Jose, Babita R, Mathew, Jimson, Ottavi, Marco

Year:

2018

Language:

english

File:

PDF, 298 KB

english, 2018

40

[IEEE 2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) - Amherst, MA, USA (2015.10.12-2015.10.14)] 2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) - Characterization of low power radiation-hard reed-solomon code protected serializers in 65-nm for HEP experiments electronics

Felici, Daniele, Bonacini, Sandro, Ottavi, Marco

Year:

2015

Language:

english

File:

PDF, 12.10 MB

english, 2015

41

Guest Editorial: IEEE Transactions on Computers and IEEE Transactions on Emerging Topics in Computing Joint Special Section on Innovation in Reconfigurable Computing Fabrics from Devices to Architectures

DeMara, Ronald F., Platzner, Marco, Ottavi, Marco

Journal:

IEEE Transactions on Emerging Topics in Computing

Year:

2017

Language:

english

File:

PDF, 152 KB

english, 2017

42

Reducing the Cost of Implementing Error Correction Codes in Content Addressable Memories

Reviriego, Pedro, Pontarelli, Salvatore, Maestro, Juan Antonio, Ottavi, Marco

Journal:

IEEE Transactions on Circuits and Systems II: Express Briefs

Year:

2013

Language:

english

File:

PDF, 761 KB

english, 2013

43

[IEEE 2015 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) - Napoli, Italy (2015.4.21-2015.4.23)] 2015 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) - 2T2M memristor based TCAM cell for low power applications

Yang, Yuanfan, Mathew, Jimson, Ottavi, Marco, Pontarelli, Salvatore, Pradhan, Dhiraj K

Year:

2015

Language:

english

File:

PDF, 337 KB

english, 2015

44

Special Issue on Design & Technology of Integrated Systems in Deep Submicron Era

Di Natale, Giorgio, Ottavi, Marco

Journal:

IEEE Transactions on Emerging Topics in Computing

Year:

2018

Language:

english

File:

PDF, 165 KB

english, 2018

45

Soft Error Tolerant Count Min Sketches

Reviriego, Pedro, Martinez, Jorge A., Ottavi, Marco

Journal:

IEEE Transactions on Computers

Year:

2020

File:

PDF, 4.27 MB

2020

46

[IEEE 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Austin, TX, USA (2012.10.3-2012.10.5)] 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - On the design of two single event tolerant slave latches for scan delay testing

Lu, Yang, Lombardi, Fabrizio, Pontarelli, Salvatore, Ottavi, Marco

Year:

2012

Language:

english

File:

PDF, 2.57 MB

english, 2012

47

[IEEE 2012 17th IEEE European Test Symposium (ETS) - Annecy, France (2012.05.28-2012.05.31)] 2012 17TH IEEE EUROPEAN TEST SYMPOSIUM (ETS) - Introducing MEDIAN: A new COST Action on manufacturable and dependable multicore architectures at nanoscale

Year:

2012

Language:

english

File:

PDF, 149 KB

english, 2012

48

[IEEE 2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) - Amherst, MA, USA (2015.10.12-2015.10.14)] 2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) - A method to protect Bloom filters from soft errors

Reviriego, Pedro, Pontarelli, Salvatore, Maestro, Juan Antonio, Ottavi, Marco

Year:

2015

Language:

english

File:

PDF, 189 KB

english, 2015

49

Opcode vector: An efficient scheme to detect soft errors in instructions

Martinez, Jorge, Atamaner, Mert, Reviriego, Pedro, Ergin, Oguz, Ottavi, Marco

Journal:

Microelectronics Reliability

Year:

2018

Language:

english

File:

PDF, 925 KB

english, 2018

50

[IEEE 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Amsterdam, Netherlands (2014.10.1-2014.10.3)] 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Using memristor state change behavior to identify faults in photovoltaic arrays

Mathew, Jimson, Ottavi, Marco, Yang, Yunfan, Pradhan, Dhiraj K.

Year:

2014

Language:

english

File:

PDF, 310 KB

english, 2014

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